Altana Micro-Wave-Scan Manual Manuel d'utilisateur télécharger pdf (Page 41)

AdvancedConguration

10.AdvancedConguration

10.1 Correction

Defects on the sample surface, such as scratches

or craters, can cause major errors in measurement

values. When Correction is activated, the affected

scan areas are cut out and the measurement

values are calculated from the sanitized data.

Pressing“operate”turnsCorrectiononandoff.

10.2 Plausibility Control

An option for comparing the corrected and

uncorrected measurement value. The greater the

difference between the corrected and uncorrected

data,themorecriticalisthesurfacedefect.Ifthe

difference is greater than 20 %, the measurement

will be evaluated as a faulty measurement. An

error message appears and a new measurement is

then needed.

Pressing“operate”turnsPlausibilityControlonand

off.

1 2 ... 36 37 38 39 40 41 42 43 44 45 46 ... 61 62

Pas de commentaire

Altana Micro-Wave-Scan Manual Manuel d'utilisateur Page 41