Altana Micro-Wave-Scan Manual Manuel d'utilisateur télécharger pdf (Page 33)

Measure

8.4 Memory with Parameter Input

By using the internal memory function of the

instrument, measurement series and samples/

checkzonescanbeidentiedbyindividualnames

during the test procedure.

Therefore, input options of the menu item

AdvancedCongurationneedtobeactivatedfor

the desired memory.

YoucanusetheexistingMEMORYinthe

instrument or create another memory name

(Parameter 1). For more information about

changeofcongurationpleaserefertosection

Conguration.

SelectamemoryforwhichInputParameter2,3,

InputCommentorInputIDareactivated.Amenu

appears to assign a name.

Iftherearepreexistingnamesforthismemory,

they are shown in a list for selection. The

>>NEW<< option opens another menu with a list

of all names available in the instrument. Here, the

menu item >>NEW<< opens an input mask which

allows you to create a new designation.

Enter the name by using the scroll wheel. When

nished,presstheoperatebutton.

Aconrmationdisplayappearswhichallowsto

verify that the entered data is correct.

Next, a selection menu may appear to enter an

additional parameter. Proceed as described above.

Ifamemoryisselectedthatalreadycontains

measurements, the test series can be continued.

Adisplayappearstoconrmthis.ByselectingNo,

a new test series will be started.

The device goes to the measurement mode, you

can start taking readings.

Parameter 2

Name:

Confirm [operate]

Change Cancel

Parameter 2

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Altana Micro-Wave-Scan Manual Manuel d'utilisateur Page 33